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Spectroscopic ellipsometry on a novel cyanine dyes in Langmuir-Blodgett multilayers 会议论文

编号：

c8e22b49-b3fb-4b3b-8112-902747ebd36c
作者：

Wang, Chuang ;Ma, Shihong ;Zeng, Hao ;Li, Jing ;Chen, Liangyao ;Wang, Wencheng ;Tian, He
作者单位：

Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China.
Fudan Univ, Dept Opt Sci & Engn, State Key Lab Adv Photon Mat & Devices, Shanghai 200433, Peoples R China.
E China Univ Sci & Technol, Chem & Pharmaceut Inst, Shanghai 200237, Peoples R China.
关键词：

spectroscopic ellipsometry; Langmuir-Blodgett film; X-ray diffraction; cyanine dye
会议名称：

COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS
会议时间：
出版信息：

2006 年 284 卷 (414 - 418)
摘要：

We have investigated on cyanine dye (HQ) in Langmuir-Blodgett (LB) films by spectroscopic ellipsometer (SE) and compared the results with that obtained by using small angle X-ray diffraction (SAXD). It is found from the isotherms that there is a critical point on Langmuir films near the area 0.8 nm(2)/molecule for HQ LB films with and without Cd2+ ions, respectively and suggested that the facts should result from the phase transition due to the change of molecular tilt angle on surface of sub-phase. The refractive indexes as a function of the wavelength; are reported by the SE method using the three layers-model (air-LB film-silicon wafer) and Cauchy dispersion equation, for the first time presented in literature. The thickness of a single deposited layer is 2.45 nm on average. The thickness of per monolayer is agreement with those obtained by SAXD measurements. (c) 2005 Elsevier B.V. All rights reserved.
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